Product Information
Product Overview
The SCANSTA111MT/NOPB is an enhanced SCAN Bridge extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment. The advantage of a multi-drop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self-test operations to be performed on one port while other scan chains are simultaneously tested.
- True IEEE 1149.1 hierarchical and multidrop addressable capability
- 7 slot inputs support up to 121 unique addresses
- 3 IEEE 1149.1 Compatible configurable local scan ports
- Mode register0 allows local TAPs to be bypassed
- LSP ACTIVE Outputs provide local port enable signals for analogue busses supporting IEEE 1149.4
- General purpose local port pass-through bits
- Known power-up state
- TRST on all local scan ports
- 32-bit TCK Counter
- 16-bit LFSR Signature compactor
- Power-OFF high impedance inputs and outputs
- Supports live insertion/withdrawal
- Green product and no Sb/Br
Applications
Industrial, Communications & Networking
Technical Specifications
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3V
TSSOP
-40°C
-
MSL 2 - 1 year
Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port
3.6V
48Pins
85°C
-
No SVHC (17-Dec-2015)
Legislation and Environmental
Country in which last significant manufacturing process was carried outCountry of Origin:Malaysia
Country in which last significant manufacturing process was carried out
RoHS
Product Compliance Certificate